Application of wavelet-analysis for image filtration in electronic and probe microscopy
https://doi.org/10.21055/0370-1069-2008-3(97)-60-63
Abstract
The review presents the results of application of the programs of discrete and stationary wavelet-analysis for filtration of object image from noise and for the increase of its resolution capability in electronic and probe microscopy.
About the Authors
N. P. Konnov
Russian Anti-Plague Research Institute Microbe, Saratov
Russian Federation
Russian Federation
Yu. P. Volkov
Saratov State Technical University, Saratov
Russian Federation
Russian Federation
M. N. Kireev
Russian Anti-Plague Research Institute Microbe, Saratov
Russian Federation
Russian Federation
O. S. Kuznetsov
Russian Anti-Plague Research Institute Microbe, Saratov
Russian Federation
Russian Federation
References
1. Гонсалес Р., Вудс Р., Эддинс С. Цифровая обработка изображений в среде MATLAB. М.: Техносфера; 2006. 616 с.
2. Смоленцев Н.К. Основы теории вейвлетов. Вейвлеты в MATLAB. М.: ДМК Пресс; 2005. 304 c.
3. Добеши И. Десять лекций по вейвлетам. Ижевск: НИЦ «Регулярная и хаотическая динамика»; 2001. 464 с.
Review
For citations:
Konnov N.P., Volkov Yu.P., Kireev M.N., Kuznetsov O.S. Application of wavelet-analysis for image filtration in electronic and probe microscopy. Problems of Particularly Dangerous Infections. 2008;(3(97)):60-63. (In Russ.) https://doi.org/10.21055/0370-1069-2008-3(97)-60-63
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